A conference on metrology for energy and environmentally friendly production will join programmes on industrial inspection, modelling aspects, and optics for arts, architecture and archaeology at SPIE Europe's Optical Metrology conference in June 2009 in Munich, Germany.

The Optical Metrology conference is chaired by Wolfgang Osten, Technical University, Stuttgart, FRG, in cooperation with co-chairs Malgorzata Kujawinska, Technical University, Warsaw, PL and Ralph Tatam of Cranfield University, Cranfield, UK.

Optical Metrology is sponsored by SPIE Europe and held in conjunction with LASER World of PHOTONICS 2009 at the Munich Fairgrounds. Dates are 14-18 June 2009. The European Optical Society (EOS), German Scientific Laser Society (WLT), and SPIE are cooperating organizations.

Approximately 300 attendees are expected at the Optical Metrology conferences. SPIE Europe is one of eight partners providing technical conferences as part of the biannual World of Photonics Congress. The event also includes the LASER World of PHOTONICS exhibition.